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Fluorescence collection from individual emitters plays a key role in state detection and remote entanglement generation, fundamental functionalities in many quantum platforms. Planar photonics have been demonstrated for robust and scalable addressing of trapped-ion systems, motivating consideration of similar elements for the complementary challenge of photon collection. Here, using an argument from the reciprocity principle, we show that far-field photon collection efficiency can be simply expressed in terms of the fields associated with the collection optic at the emitter position alone. We calculate collection efficiencies into ideal paraxial and fully vectorial focused Gaussian modes parameterized in terms of focal waist, and further quantify the modest enhancements possible with more general beam profiles, establishing design requirements for efficient collection. Toward practical implementation, we design, fabricate, and characterize two diffractive collection elements operating atλ = 397 nm; a forward emitting design is predicted to offer 0.25% collection efficiency into a single waveguide mode, while a more efficient reverse-emitting design offers 1.14% collection efficiency, albeit with more demanding fabrication requirements. Close agreement between simulated and measured emission for both designs indicates practicality of these collection efficiencies, and we indicate avenues to improved devices approaching the limits predicted for ideal beams. We point out a particularly simple integrated waveguide configuration for polarization-based remote entanglement generation enabled by integrated collection. 

Sagnac interferometry can provide a substantial improvement in signal-to-noise ratio compared to conventional magnetic imaging based on the magneto-optical Kerr effect. We show that this improvement is sufficient to allow quantitative measurements of current-induced magnetic deflections due to spin-orbit torque even in thin-film magnetic samples with perpendicular magnetic anisotropy, for which the Kerr rotation is second order in the magnetic deflection. Sagnac interferometry can also be applied beneficially for samples with in-plane anisotropy, for which the Kerr rotation is first order in the deflection angle. Optical measurements based on Sagnac interferometry can therefore provide a cross-check on electrical techniques for measuring spin-orbit torque. Different electrical techniques commonly give quantitatively inconsistent results so that Sagnac interferometry can help to identify which techniques are affected by unidentified artifacts.